Visual field defects in acute optic neuritis - Distribution of different types of defect pattern, assessed with threshold-related supraliminal perimetry, ensuring high spatial resolution

J. Nevalainen, E. Krapp, J. Paetzold, I. Mildenberger, D. Besch, R. Vonthein, J. L. Keltner, C. A. Johnson, Ulrich Schiefer^*

^*Corresponding author for this work