Abstract
We have measured the resistance of commercial thick-film chip resistors (Dale Type RC550, nominal resistance R = 500 Ω) as a function of temperature (8 mK ≤ T ≤ 10 K) and magnetic field B ≤ 7 T (for T ≥ 0.3 K) at different orientations between input current, main area and magnetic field. At 30 mK ≤ T < 10 K the temperature dependence of the resistance follows R = A exp (B/T1/4) in agreement with published data for a 1 kΩ thick-film chip resistance. In contrast to previously published studies of similar resistors we measured a resistance that increases approximately linearly with field at T < 1 K and quadratically at higher temperatures. The sensitivity to magnetic fields decreases from (0.8 ± 0.1)% T-1 at 0.3 K to 0.1% T-1 above 2 K for B=1 T.
| Original language | English |
|---|---|
| Journal | Cryogenics |
| Volume | 36 |
| Issue number | 4 |
| Pages (from-to) | 231-234 |
| Number of pages | 4 |
| ISSN | 0011-2275 |
| DOIs | |
| Publication status | Published - 04.1996 |
Funding
We wish to acknowledge the help of E. Faulhaber and E. Gaganidze with some of the measurementsa nd G. Eska for carefully reading the manuscript.T his work was made possible by the supporto f the DeutscheF orschungsgemein-schaft under Grant Es 86-2/2.
