Skip to main navigation
Skip to search
Skip to main content
University of Luebeck Home
English
Deutsch
Home
Research Units
Experts
Projects
Publications
Prizes
Spin-Offs
Media
Activities
Search by expertise, name or affiliation
Statistical Fourier Descriptors for Defect Image Classification
Fabian Timm,
Thomas Martinetz
Institute of Neuro- and Bioinformatics
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Statistical Fourier Descriptors for Defect Image Classification'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering & Materials Science
Seam welding
100%
Image classification
76%
Industrial applications
65%
Inspection
54%
Statistics
53%
Defects
48%