Regularizing orientation estimation in cryogenic electron microscopy three-dimensional map refinement through measure-based lifting over riemannian manifolds

Willem Diepeveen; Jan Lellmann; Ozan Öktem; Carola-Bibiane Schönlieb

Regularizing orientation estimation in cryogenic electron microscopy three-dimensional map refinement through measure-based lifting over riemannian manifolds

Willem Diepeveen, Jan Lellmann, Ozan Öktem, Carola-Bibiane Schönlieb

Institute of Mathematics and Image Computing

Original language	Undefined/Unknown
Journal	SIAM Journal on Imaging Sciences
Volume	16
Issue number	3
Pages (from-to)	1440-1490
Number of pages	51
Publication status	Published - 2023

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

Cite this

@article{04e6b66562234db5a55ffad3d4c28a8c,

title = "Regularizing orientation estimation in cryogenic electron microscopy three-dimensional map refinement through measure-based lifting over riemannian manifolds",

author = "Willem Diepeveen and Jan Lellmann and Ozan {\"O}ktem and Carola-Bibiane Sch{\"o}nlieb",

year = "2023",

language = "undefiniert/unbekannt",

volume = "16",

pages = "1440--1490",

journal = "SIAM Journal on Imaging Sciences",

issn = "1936-4954",

publisher = "Society for Industrial and Applied Mathematics Publications",

number = "3",

}

Regularizing orientation estimation in cryogenic electron microscopy three-dimensional map refinement through measure-based lifting over riemannian manifolds. / Diepeveen, Willem; Lellmann, Jan; Öktem, Ozan et al.
In: SIAM Journal on Imaging Sciences, Vol. 16, No. 3, 2023, p. 1440-1490.

Research output: Journal Articles › Journal articles › Research › peer-review

TY - JOUR

T1 - Regularizing orientation estimation in cryogenic electron microscopy three-dimensional map refinement through measure-based lifting over riemannian manifolds

AU - Diepeveen, Willem

AU - Lellmann, Jan

AU - Öktem, Ozan

AU - Schönlieb, Carola-Bibiane

PY - 2023

Y1 - 2023

M3 - Zeitschriftenaufsätze

SN - 1936-4954

VL - 16

SP - 1440

EP - 1490

JO - SIAM Journal on Imaging Sciences

JF - SIAM Journal on Imaging Sciences

IS - 3

ER -