Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging

Charlotte Uetrecht; Kristina Lorenzen; MatthÃ¤us Kitel; Johannes Heidemann; Jesse Huron Robinson Spencer; Hartmut SchlÃ¼ter; Joachim Schulz

doi:10.1107/s1600577519002686

Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging

Charlotte Uetrecht, Kristina Lorenzen, MatthÃ¤us Kitel, Johannes Heidemann, Jesse Huron Robinson Spencer, Hartmut SchlÃ¼ter, Joachim Schulz

Institute of Chemistry and Metabolomics

9 Citations (Scopus)

Original language	Undefined/Unknown
Journal	Journal of Synchrotron Radiation
Volume	26
Issue number	3
Pages (from-to)	653-659
Number of pages	7
ISSN	0909-0495
DOIs	https://doi.org/10.1107/s1600577519002686
Publication status	Published - 01.04.2019

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10.1107/s1600577519002686

https://doi.org/10.1107%2Fs1600577519002686

Cite this

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title = "Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging",

author = "Charlotte Uetrecht and Kristina Lorenzen and Matth{\~A}¤us Kitel and Johannes Heidemann and Spencer, \{Jesse Huron Robinson\} and Hartmut Schl{\~A}¼ter and Joachim Schulz",

year = "2019",

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language = "undefiniert/unbekannt",

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T1 - Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging

AU - Uetrecht, Charlotte

AU - Lorenzen, Kristina

AU - Kitel, MatthÃ¤us

AU - Heidemann, Johannes

AU - Spencer, Jesse Huron Robinson

AU - SchlÃ¼ter, Hartmut

AU - Schulz, Joachim

PY - 2019/4/1

Y1 - 2019/4/1

U2 - 10.1107/s1600577519002686

DO - 10.1107/s1600577519002686

M3 - Zeitschriftenaufsätze

SN - 0909-0495

VL - 26

SP - 653

EP - 659

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

IS - 3

ER -