Material Scanner Using mmW-Radiation

Christian Krebs, Dirk Nüßler, Sven Heinen, Daniel Zeru, Thorsten M. Buzug


The aim of this project is the development of a measurement system in millimetre wave frequency range for material or medical analysis. Owing to the growing demand for low cost and high performance systems as in the quality control of modern production lines requires a new generation of measurement systems. The characterization of the millimetre wave system and the advantages of the imaging systems using mmW-radiation will be presented.

Original languageEnglish
Title of host publication2006 European Microwave Conference
Number of pages4
Publication date01.12.2007
Article number4058111
ISBN (Print)2-9600551-6-0
Publication statusPublished - 01.12.2007
Event36th European Microwave Conference - Manchester, United Kingdom
Duration: 10.09.200612.09.2006
Conference number: 71711


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