In this paper we propose a novel Design-Technology Co-Optimization (DTCO) framework that enables PDK generation and design implementation of sub-10nm technology nodes. The framework allows to study the impact of different technology options at design level and use effective design Power, Performance and Area (PPA) to decide on right technology option. Design implementation flow is IR-drop aware, allowing integration of optimized Power Delivery Network (PDN) for different device/cell options. Using N5-like technology node assumptions (contacted poly and metallization pitch of 42 and 32nm), we generate digital PDKs for different device (finFET, 2 & 3 nanowires) and standard cell options (3, 2 or 1 fins & 7.5 or 6-Tracks cell height). Different PDKs have been used to implement and characterize a wire dominated circuit. Our study shows that the design PDN/IR-drop awareness is fundamental to complete DTCO approach for sub-10nm nodes. Using our dedicated design methodology we reach the IR-drop target of 2.5% VDD (on the lowest metal layers), while minimizing the area degradation induced by the PDN. Further, we demonstrate that such optimized PDN is mandatory to enable the 20% area gain when moving from 7.5 to 6-Tracks cell height. Finally, we show that the impact of different device options is in range of 15% Power, 2X Performance and 20% Area, further validating the need of a fully integrated DTCO.
|Title of host publication||2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)|
|Publication status||Published - 13.12.2017|
|Event||2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - |
Duration: 13.11.2017 → 16.11.2017