Further system characterization of the single-sided mpi scanner with two-and three-dimensional measurements

Yvonne Blancke Soares*, Kerstin Lüdtke-Buzug, Anselm von Gladiss, Christina Debbeler, Thorsten M. Buzug, Ksenija Gräfe

*Corresponding author for this work
3 Citations (Scopus)

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