Finite Element Simulation of Transcranial Current Stimulation in Realistic Rat Head Model

Fernando Gasca; Lisa Marshall; Sonja Binder; Alexander Schlaefer; Ulrich G. Hofmann; Achim Schweikard

doi:10.1109/NER.2011.5910483

Finite Element Simulation of Transcranial Current Stimulation in Realistic Rat Head Model

Fernando Gasca, Lisa Marshall, Sonja Binder, Alexander Schlaefer, Ulrich G. Hofmann, Achim Schweikard

Abstract

Transcranial current stimulation (tCS) is a method for modulating neural excitability and is used widely for studying brain function. Although tCS has been used on the rat, there is limited knowledge on the induced electric field distribution during stimulation. This work presents the finite element (FE) simulations of tCS in a realistic rat head model derived from MRI data. We simulated two electrode configurations and analyzed the spatial focality of the induced electric field for three implantation depth scenarios : (1) electrode implanted at the surface of the skull, (2) halfway through the skull and (3) in contact with cerebrospinal fluid. We quantitatively show the change in focality of stimulation with depth. This work emphasizes the importance of performing FE analysis in realistic models as a vital step in the design of tCS rat experiments. This can yield a better understanding of the location and intensity of stimulation, and its correlation to brain function.

Original language	English
Title of host publication	2011 5th International IEEE/EMBS Conference on Neural Engineering
Number of pages	4
Publisher	IEEE
Publication date	20.07.2011
Pages	36-39
Article number	5910483
ISBN (Print)	978-1-4244-4140-2, 978-1-4244-4141-9
DOIs	https://doi.org/10.1109/NER.2011.5910483
Publication status	Published - 20.07.2011
Event	2011 5th International IEEE/EMBS Conference on Neural Engineering - Cancun, Mexico Duration: 27.04.2011 → 01.05.2011 Conference number: 85524

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Gasca, F., Marshall, L., Binder, S., Schlaefer, A., Hofmann, U. G., & Schweikard, A. (2011). Finite Element Simulation of Transcranial Current Stimulation in Realistic Rat Head Model. In 2011 5th International IEEE/EMBS Conference on Neural Engineering (pp. 36-39). Article 5910483 (International IEEE/EMBS Conference on Neural Engineering). IEEE. https://doi.org/10.1109/NER.2011.5910483

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title = "Finite Element Simulation of Transcranial Current Stimulation in Realistic Rat Head Model",

abstract = "Transcranial current stimulation (tCS) is a method for modulating neural excitability and is used widely for studying brain function. Although tCS has been used on the rat, there is limited knowledge on the induced electric field distribution during stimulation. This work presents the finite element (FE) simulations of tCS in a realistic rat head model derived from MRI data. We simulated two electrode configurations and analyzed the spatial focality of the induced electric field for three implantation depth scenarios : (1) electrode implanted at the surface of the skull, (2) halfway through the skull and (3) in contact with cerebrospinal fluid. We quantitatively show the change in focality of stimulation with depth. This work emphasizes the importance of performing FE analysis in realistic models as a vital step in the design of tCS rat experiments. This can yield a better understanding of the location and intensity of stimulation, and its correlation to brain function.",

author = "Fernando Gasca and Lisa Marshall and Sonja Binder and Alexander Schlaefer and Hofmann, {Ulrich G.} and Achim Schweikard",

year = "2011",

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doi = "10.1109/NER.2011.5910483",

language = "English",

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series = "International IEEE/EMBS Conference on Neural Engineering",

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note = "2011 5th International IEEE/EMBS Conference on Neural Engineering , NER 2011 ; Conference date: 27-04-2011 Through 01-05-2011",

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Gasca, F, Marshall, L , Binder, S, Schlaefer, A, Hofmann, UG & Schweikard, A 2011, Finite Element Simulation of Transcranial Current Stimulation in Realistic Rat Head Model. in 2011 5th International IEEE/EMBS Conference on Neural Engineering., 5910483, International IEEE/EMBS Conference on Neural Engineering, IEEE, pp. 36-39, 2011 5th International IEEE/EMBS Conference on Neural Engineering , Cancun, Mexico, 27.04.11. https://doi.org/10.1109/NER.2011.5910483

Finite Element Simulation of Transcranial Current Stimulation in Realistic Rat Head Model. / Gasca, Fernando; Marshall, Lisa ; Binder, Sonja et al.
2011 5th International IEEE/EMBS Conference on Neural Engineering. IEEE, 2011. p. 36-39 5910483 (International IEEE/EMBS Conference on Neural Engineering).

Research output: Chapters in Books/Reports/Conference Proceedings › Conference contribution › peer-review

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AU - Binder, Sonja

AU - Schlaefer, Alexander

AU - Hofmann, Ulrich G.

AU - Schweikard, Achim

N1 - Conference code: 85524

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N2 - Transcranial current stimulation (tCS) is a method for modulating neural excitability and is used widely for studying brain function. Although tCS has been used on the rat, there is limited knowledge on the induced electric field distribution during stimulation. This work presents the finite element (FE) simulations of tCS in a realistic rat head model derived from MRI data. We simulated two electrode configurations and analyzed the spatial focality of the induced electric field for three implantation depth scenarios : (1) electrode implanted at the surface of the skull, (2) halfway through the skull and (3) in contact with cerebrospinal fluid. We quantitatively show the change in focality of stimulation with depth. This work emphasizes the importance of performing FE analysis in realistic models as a vital step in the design of tCS rat experiments. This can yield a better understanding of the location and intensity of stimulation, and its correlation to brain function.

AB - Transcranial current stimulation (tCS) is a method for modulating neural excitability and is used widely for studying brain function. Although tCS has been used on the rat, there is limited knowledge on the induced electric field distribution during stimulation. This work presents the finite element (FE) simulations of tCS in a realistic rat head model derived from MRI data. We simulated two electrode configurations and analyzed the spatial focality of the induced electric field for three implantation depth scenarios : (1) electrode implanted at the surface of the skull, (2) halfway through the skull and (3) in contact with cerebrospinal fluid. We quantitatively show the change in focality of stimulation with depth. This work emphasizes the importance of performing FE analysis in realistic models as a vital step in the design of tCS rat experiments. This can yield a better understanding of the location and intensity of stimulation, and its correlation to brain function.

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T3 - International IEEE/EMBS Conference on Neural Engineering

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BT - 2011 5th International IEEE/EMBS Conference on Neural Engineering

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T2 - 2011 5th International IEEE/EMBS Conference on Neural Engineering

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ER -

Finite Element Simulation of Transcranial Current Stimulation in Realistic Rat Head Model

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