Analyzing Superparamagnetic Iron Oxide Nanoparticles (SPIONs) using Electrical Impedance Spectroscopy

T.  Welzel; C. Debbeler; M. Graeser; S. Kaufmann; R. Kusche; K. Lüdtke-Buzug

doi:10.1109/IWMPI.2015.7107062

Analyzing Superparamagnetic Iron Oxide Nanoparticles (SPIONs) using Electrical Impedance Spectroscopy

T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, K. Lüdtke-Buzug

Institute of Medical Engineering

Abstract

Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles (SPIONs) and their coatings used in magnetic particle imaging (MPI) include photon cross-correlation spectroscopy (PCCS) [1], atomic force microscopy (AFM) [1] and transmission electron microscopy (TEM) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.

Original language	English
Title of host publication	2015 5th International Workshop on Magnetic Particle Imaging (IWMPI)
Number of pages	1
Publisher	IEEE
Publication date	01.03.2015
ISBN (Print)	978-1-4799-7269-2
ISBN (Electronic)	978-1-4799-7271-5
DOIs	https://doi.org/10.1109/IWMPI.2015.7107062
Publication status	Published - 01.03.2015
Event	5th International Workshop on Magnetic Particle Imaging (IWMPI) - Istanbul, Turkey Duration: 26.03.2015 → 28.03.2015

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title = "Analyzing Superparamagnetic Iron Oxide Nanoparticles (SPIONs) using Electrical Impedance Spectroscopy",

abstract = "Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles (SPIONs) and their coatings used in magnetic particle imaging (MPI) include photon cross-correlation spectroscopy (PCCS) [1], atomic force microscopy (AFM) [1] and transmission electron microscopy (TEM) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.",

author = "T. Welzel and C. Debbeler and M. Graeser and S. Kaufmann and R. Kusche and K. L{\"u}dtke-Buzug",

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Welzel, T, Debbeler, C , Graeser, M, Kaufmann, S, Kusche, R & Lüdtke-Buzug, K 2015, Analyzing Superparamagnetic Iron Oxide Nanoparticles (SPIONs) using Electrical Impedance Spectroscopy. in 2015 5th International Workshop on Magnetic Particle Imaging (IWMPI). IEEE Proceedings, IEEE, 5th International Workshop on Magnetic Particle Imaging (IWMPI), Istanbul, Turkey, 26.03.15. https://doi.org/10.1109/IWMPI.2015.7107062

TY - GEN

T1 - Analyzing Superparamagnetic Iron Oxide Nanoparticles (SPIONs) using Electrical Impedance Spectroscopy

AU - Welzel, T.

AU - Debbeler, C.

AU - Graeser, M.

AU - Kaufmann, S.

AU - Kusche, R.

AU - Lüdtke-Buzug, K.

PY - 2015/3/1

Y1 - 2015/3/1

N2 - Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles (SPIONs) and their coatings used in magnetic particle imaging (MPI) include photon cross-correlation spectroscopy (PCCS) [1], atomic force microscopy (AFM) [1] and transmission electron microscopy (TEM) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.

AB - Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles (SPIONs) and their coatings used in magnetic particle imaging (MPI) include photon cross-correlation spectroscopy (PCCS) [1], atomic force microscopy (AFM) [1] and transmission electron microscopy (TEM) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.

U2 - 10.1109/IWMPI.2015.7107062

DO - 10.1109/IWMPI.2015.7107062

M3 - Conference contribution

SN - 978-1-4799-7269-2

T3 - IEEE Proceedings

BT - 2015 5th International Workshop on Magnetic Particle Imaging (IWMPI)

PB - IEEE

T2 - 5th International Workshop on Magnetic Particle Imaging (IWMPI)

Y2 - 26 March 2015 through 28 March 2015

ER -

Analyzing Superparamagnetic Iron Oxide Nanoparticles (SPIONs) using Electrical Impedance Spectroscopy

Abstract

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