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Accurate, fast, and robust centre localisation for images of semiconductor components
Fabian Timm,
Erhardt Barth
Institute of Neuro- and Bioinformatics
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Engineering & Materials Science
Semiconductor materials
100%
Hough transforms
99%
Pixels
84%
Object detection
29%
Light emitting diodes
27%
Computer vision
23%
Electrodes
21%
Inspection
21%