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A two-stage-classifier for defect classification in optical media inspection
Daniel Toth
*
, Alexandru Condurache, Til Aach
*
Corresponding author for this work
Institute of Signal Processing
6
Citations (Scopus)
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Keyphrases
Minimum Distance Classifier
100%
Two-stage Classifier
100%
Defect Classification
100%
Real-time Operation
33%
Compact Disc
33%
Industrial Inspection
33%
Production Process
33%
Digital Versatile Disc
33%
INIS
inspection
100%
fuzzy logic
75%
Computer Science
Training Data
33%
Classification Algorithm
33%
Pattern Recognition Systems
33%