A new shift estimation algorithm for barcode super resolution

T. Edeler; M. Arbeiter; K. Ohliger; S. Hussmann; A. Mertins

doi:10.1109/ICOSP.2010.5655759

A new shift estimation algorithm for barcode super resolution

T. Edeler, M. Arbeiter, K. Ohliger, S. Hussmann, A. Mertins

Institute of Signal Processing

Abstract

In this paper we propose a novel way of estimating the rotation angle (shifts between consecutive scan lines) of bar codes in 2D images. The proposed method is compared to a well-established method, and results with real and simulated image data are presented.

Original language	English
Title of host publication	IEEE 10th INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING PROCEEDINGS
Number of pages	4
Place of Publication	Beijing, China
Publisher	IEEE
Publication date	01.10.2010
Pages	720-723
Article number	5655759
ISBN (Print)	978-1-4244-5897-4 , 978-1-4244-5899-8
ISBN (Electronic)	978-1-4244-5900-1
DOIs	https://doi.org/10.1109/ICOSP.2010.5655759
Publication status	Published - 01.10.2010
Event	2010 IEEE 10th International Conference on Signal Processing - Beijing, China Duration: 24.10.2010 → 28.10.2010 Conference number: 83255

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10.1109/ICOSP.2010.5655759

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title = "A new shift estimation algorithm for barcode super resolution",

abstract = "In this paper we propose a novel way of estimating the rotation angle (shifts between consecutive scan lines) of bar codes in 2D images. The proposed method is compared to a well-established method, and results with real and simulated image data are presented.",

author = "T. Edeler and M. Arbeiter and K. Ohliger and S. Hussmann and A. Mertins",

year = "2010",

month = oct,

day = "1",

doi = "10.1109/ICOSP.2010.5655759",

language = "English",

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publisher = "IEEE",

pages = "720--723",

booktitle = "IEEE 10th INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING PROCEEDINGS",

note = "2010 IEEE 10th International Conference on Signal Processing, ICSP2010 ; Conference date: 24-10-2010 Through 28-10-2010",

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Edeler, T, Arbeiter, M, Ohliger, K, Hussmann, S & Mertins, A 2010, A new shift estimation algorithm for barcode super resolution. in IEEE 10th INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING PROCEEDINGS., 5655759, International Conference on Signal Processing Proceedings, ICSP, IEEE, Beijing, China , pp. 720-723, 2010 IEEE 10th International Conference on Signal Processing, Beijing, China, 24.10.10. https://doi.org/10.1109/ICOSP.2010.5655759

A new shift estimation algorithm for barcode super resolution. / Edeler, T.; Arbeiter, M.; Ohliger, K. et al.
IEEE 10th INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING PROCEEDINGS. Beijing, China : IEEE, 2010. p. 720-723 5655759 (International Conference on Signal Processing Proceedings, ICSP).

Research output: Chapters in Books/Reports/Conference Proceedings › Conference contribution › peer-review

TY - GEN

T1 - A new shift estimation algorithm for barcode super resolution

AU - Edeler, T.

AU - Arbeiter, M.

AU - Ohliger, K.

AU - Hussmann, S.

AU - Mertins, A.

N1 - Conference code: 83255

PY - 2010/10/1

Y1 - 2010/10/1

N2 - In this paper we propose a novel way of estimating the rotation angle (shifts between consecutive scan lines) of bar codes in 2D images. The proposed method is compared to a well-established method, and results with real and simulated image data are presented.

AB - In this paper we propose a novel way of estimating the rotation angle (shifts between consecutive scan lines) of bar codes in 2D images. The proposed method is compared to a well-established method, and results with real and simulated image data are presented.

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U2 - 10.1109/ICOSP.2010.5655759

DO - 10.1109/ICOSP.2010.5655759

M3 - Conference contribution

SN - 978-1-4244-5897-4

SN - 978-1-4244-5899-8

T3 - International Conference on Signal Processing Proceedings, ICSP

SP - 720

EP - 723

BT - IEEE 10th INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING PROCEEDINGS

PB - IEEE

CY - Beijing, China

T2 - 2010 IEEE 10th International Conference on Signal Processing

Y2 - 24 October 2010 through 28 October 2010

ER -

A new shift estimation algorithm for barcode super resolution

Abstract

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