Online Analysis of Debug Trace Data for Embedded Systems

Normann Decker, Boris Dreyer, Philip Gottschling, Christian Hochberger, Alexander Lange, Martin Leucker, Torben Scheffel, Simon Wegener, Alexander Weiss

Abstract

Modern multi-core Systems-on-Chip (SoC) provide very high computational power. On the downside, they are hard to debug and it is often very difficult to understand what is going on in these chips because of the limited observability inside the SoC. Chip manufacturers try to compensate this difficulty by providing highly compressed trace data from the individual cores. In the past, the common way to deal with this data was storing it for later offline analysis, which severely limits the time span that can be observed. In this contribution, we present an FPGA-based solution that is able to process the trace data in real-time, enabling continuous observation of the state of a core. Moreover, we discuss applications enabled by this technology.
OriginalspracheEnglisch
Titel2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Seitenumfang6
Band2018-January
Herausgeber (Verlag)IEEE
Erscheinungsdatum19.04.2018
Seiten851-856
ISBN (Print)978-3-9819263-1-6
ISBN (elektronisch)978-3-9819263-0-9
DOIs
PublikationsstatusVeröffentlicht - 19.04.2018
Veranstaltung2018 Design, Automation and Test in Europe Conference and Exhibition
- International Congress Center Dresden, Dresden, Deutschland
Dauer: 19.03.201823.03.2018
Konferenznummer: 136090

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